Telcordia software to calculate the reliability prediction of electronic equipment based on the Telcordia (Bellcore) TR and SR standards. Free trial. Telcordia Telecom Information SuperStore – Reliability Prediction Procedure for The following documents were fully or partly replaced by SR TR Bellcore TR – Download as PDF File .pdf), Text File .txt) or read online.

The MIL-217, Bellcore/Telcordia and other reliability predictions methods are. According to the handbook, the failure rate of a commercial ceramic capacitor of. The latest two updates are SR-332 Issue 2 (September 2006) and SR-332. Telcordia (Bellcore) SR-332 / TR-332.Reliability prediction model evolved from telecom industry equipment experience.First developed by Bellcore Communications research, based on MIL217.Lower and more conservative values for MTBF.Availability with relation to failures per billion component operation hours.

These standards use a series of models for various categories of electronic, electrical and electro-mechanical components to predict steady-state failure rates which environmental conditions, quality levels, electrical stress conditions and various other parameters affect. Among these approaches, three main categories are often used within government and industry: The following documents were fully or partly replaced by SR There are reasons for this variation.

Features Powerful and user friendly Telcordia telecom standard reliability prediction software Combine prediction methods for complex analysis Optimize designs to meet targeed goals Select components with regard to reliability and cost savings Be more accurate and efficient than with manual methods Take advantage of powerful ‘what if’ bellcoree tools Identify weakareas in a system design Build and open multiple systems and projects files Drag and drop components and systems between projects Powerful charting facilities.

After the analysis is complete, ITEM ToolKit’s integrated environment comes into its own tr-3332 powerful conversion facilities for transferring data to other modules of the program.

There are many different empirical methods that have been created for specific applications. To download a free demonstration of our Telcordia software click here.

Parts Count Method II: At the end of the s, J. Notice 1 in and Notice 2 in Some parameters in the curve function can be modified by integrating engineering knowledge.

Bellcore/Telcordia Predictions

The system’s failure rate is equal to the sum of the failure rates of the components involved. The life testing method may also be preferred over both the empirical and physics of failure methods when it is necessary to obtain realistic predictions at the belocore rather than component level. Time plot and the calculated B10 life for the analysis. Issue 4 of SR provides all the tools tr-33 for predicting device and unit hardware reliability, and contains important revisions since the document was last issued.

These powerful facilities transfer as much of the available information as possible, saving you valuable time and effort.

This valuable feature comes in especially handy when it is necessary to transfer data from one project or library to another. This procedure also documents a recommended method for predicting serial system hardware reliability. The empirical or standards based methods can be used in the design stage to quickly obtain a rough estimation of product reliability. From Figure 4, we can see that the estimated activation energy in the Arrhenius model is 0.

The Black model employs external heating and increased current density and is given by:. It can also be used for:.

Telcordia Electronic Reliability Prediction Software to TR and SR Standards

Tables needed to facilitate the calculation of reliability predictions. These predictions provide necessary input to system-level bsllcore models for predicting expected downtime per year and system availability. In this article, we will provide an overview of all three approaches. A model known as the modified Coffin-Manson model has been used successfully to model crack growth in solder due to repeated temperature cycling as the device is switched on and off.

Bellcore/Telcordia Reliability Prediction in Lambda Predict

Clarification and guidance on items raised by forum participants and by frequently asked questions from users. Recommended methods for predicting device and unit hardware reliability. Since it is a chemical process, the aging of a capacitor such as an electrolytic capacitor is accelerated by increasing the operating temperature.

The assumption is made that system or equipment failure causes are inherently linked to components whose failures are independent of each other.

According to different physics of failure mechanisms, one more term i. Black developed an empirical model to estimate the MTTF of a wire, taking electromigration into consideration, which is now generally known as the Black model. These techniques estimate the mean failure rate bellvore FITs for electronic equipment.

Therefore, in order to consider the complexity of the entire system, life tests can be conducted at the system level, treating the system as a “black box,” and the system reliability can be predicted based on the obtained failure belcore. Screen shots click to enlarge.

According to the handbook, the failure rate of a commercial ceramic capacitor of 0.

In physics of failure approaches, the model parameters can be determined from tr-33 specs or from test data. The current density J and temperature T are factors in the design process that affect electromigration. Accurate prediction of the reliability of electronic products requires knowledge of the components, the design, the manufacturing process and the expected operating conditions.

Device and unit failure rate predictions generated using this procedure are applicable for commercial electronic products whose physical design, manufacture, installation, and reliability assurance practices meet the appropriate Telcordia or equivalent generic and product-specific requirements. On Reliabilityvol. This assumes that there are no interaction failures between the components but, in reality, due to the design or manufacturing, components are not independent.

A given electronic component will have multiple failure modes and the component’s failure rate is equal to the sum of the failure rates of all modes i. Several popularly used models are discussed next. Reliability prediction is an important element in the process of designing or selecting equipment. Generally, chemical reactions can be accelerated by increasing brllcore system temperature.

It can also be used directly by telecommunications service providers for product reliability evaluation. Numerous experiments with different stress conditions bfllcore been reported in the literature, where the values have been reported in the range between 2 and 3.